JPH0446217Y2 - - Google Patents
Info
- Publication number
- JPH0446217Y2 JPH0446217Y2 JP18260487U JP18260487U JPH0446217Y2 JP H0446217 Y2 JPH0446217 Y2 JP H0446217Y2 JP 18260487 U JP18260487 U JP 18260487U JP 18260487 U JP18260487 U JP 18260487U JP H0446217 Y2 JPH0446217 Y2 JP H0446217Y2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- unit
- guide arm
- movable
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000523 sample Substances 0.000 claims description 43
- 239000000758 substrate Substances 0.000 claims description 10
- 238000007689 inspection Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 description 11
- 230000002950 deficient Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18260487U JPH0446217Y2 (en]) | 1987-11-30 | 1987-11-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18260487U JPH0446217Y2 (en]) | 1987-11-30 | 1987-11-30 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0187264U JPH0187264U (en]) | 1989-06-08 |
| JPH0446217Y2 true JPH0446217Y2 (en]) | 1992-10-29 |
Family
ID=31474051
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18260487U Expired JPH0446217Y2 (en]) | 1987-11-30 | 1987-11-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0446217Y2 (en]) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6788078B2 (en) | 2001-11-16 | 2004-09-07 | Delaware Capital Formation, Inc. | Apparatus for scan testing printed circuit boards |
-
1987
- 1987-11-30 JP JP18260487U patent/JPH0446217Y2/ja not_active Expired
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6788078B2 (en) | 2001-11-16 | 2004-09-07 | Delaware Capital Formation, Inc. | Apparatus for scan testing printed circuit boards |
| US7071716B2 (en) | 2001-11-16 | 2006-07-04 | Delaware Capital Formation, Inc. | Apparatus for scan testing printed circuit boards |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0187264U (en]) | 1989-06-08 |
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